Saglam, M. Et Al. 1997. Influences of thermal annealing, the electrolyte pH, and current density on the interface state density distribution of anodic MOS structures. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING , vol.65, no.1 , 33-37.

Saglam, M., Türüt, A., NUHOĞLU, Ç., Efeoğlu, H., Kılıçoğlu, T., & Ebeoğlu, M., (1997). Influences of thermal annealing, the electrolyte pH, and current density on the interface state density distribution of anodic MOS structures. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING , vol.65, no.1, 33-37.

Saglam, M Et Al. "Influences of thermal annealing, the electrolyte pH, and current density on the interface state density distribution of anodic MOS structures," APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING , vol.65, no.1, 33-37, 1997

Saglam, M Et Al. "Influences of thermal annealing, the electrolyte pH, and current density on the interface state density distribution of anodic MOS structures." APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING , vol.65, no.1, pp.33-37, 1997

Saglam, M. Et Al. (1997) . "Influences of thermal annealing, the electrolyte pH, and current density on the interface state density distribution of anodic MOS structures." APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING , vol.65, no.1, pp.33-37.

@article{article, author={M Saglam Et Al. }, title={Influences of thermal annealing, the electrolyte pH, and current density on the interface state density distribution of anodic MOS structures}, journal={APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING}, year=1997, pages={33-37} }