NUHOĞLU, Ç. 2002. The determination of the interface-state density distribution from the capasitance-frequency measurements in Au/n-Si Schottky Barrier diodes. JOURNAL OF ELECTRONIC MATERIALS , vol.31, no.1 , 119-123.

NUHOĞLU, Ç., (2002). The determination of the interface-state density distribution from the capasitance-frequency measurements in Au/n-Si Schottky Barrier diodes. JOURNAL OF ELECTRONIC MATERIALS , vol.31, no.1, 119-123.

NUHOĞLU, Çiğdem. "The determination of the interface-state density distribution from the capasitance-frequency measurements in Au/n-Si Schottky Barrier diodes," JOURNAL OF ELECTRONIC MATERIALS , vol.31, no.1, 119-123, 2002

NUHOĞLU, Çiğdem. "The determination of the interface-state density distribution from the capasitance-frequency measurements in Au/n-Si Schottky Barrier diodes." JOURNAL OF ELECTRONIC MATERIALS , vol.31, no.1, pp.119-123, 2002

NUHOĞLU, Ç. (2002) . "The determination of the interface-state density distribution from the capasitance-frequency measurements in Au/n-Si Schottky Barrier diodes." JOURNAL OF ELECTRONIC MATERIALS , vol.31, no.1, pp.119-123.

@article{article, author={Çiğdem NUHOĞLU}, title={The determination of the interface-state density distribution from the capasitance-frequency measurements in Au/n-Si Schottky Barrier diodes}, journal={JOURNAL OF ELECTRONIC MATERIALS}, year=2002, pages={119-123} }