ÖZDEMİR, O. Et Al. 2014. Dielectric Strength of WO3 Thin Films By Admittance and Ellipsometry Measurements. 4th International Advances in Applied Physics and Materials Science Congress & Exhibition , (Muğla, Turkey), 346.

ÖZDEMİR, O., CHOI, F. P., BULGURCUOĞLU, A. E., & KUTLU, K., (2014). Dielectric Strength of WO3 Thin Films By Admittance and Ellipsometry Measurements . 4th International Advances in Applied Physics and Materials Science Congress & Exhibition (pp.346). Muğla, Turkey

ÖZDEMİR, Orhan Et Al. "Dielectric Strength of WO3 Thin Films By Admittance and Ellipsometry Measurements," 4th International Advances in Applied Physics and Materials Science Congress & Exhibition, Muğla, Turkey, 2014

ÖZDEMİR, Orhan Et Al. "Dielectric Strength of WO3 Thin Films By Admittance and Ellipsometry Measurements." 4th International Advances in Applied Physics and Materials Science Congress & Exhibition , Muğla, Turkey, pp.346, 2014

ÖZDEMİR, O. Et Al. (2014) . "Dielectric Strength of WO3 Thin Films By Admittance and Ellipsometry Measurements." 4th International Advances in Applied Physics and Materials Science Congress & Exhibition , Muğla, Turkey, p.346.

@conferencepaper{conferencepaper, author={Orhan ÖZDEMİR Et Al. }, title={Dielectric Strength of WO3 Thin Films By Admittance and Ellipsometry Measurements}, congress name={4th International Advances in Applied Physics and Materials Science Congress & Exhibition}, city={Muğla}, country={Turkey}, year={2014}, pages={346} }