ÖZDEMİR, O. Et Al. 2014. Dielectric Strength of WO3 Thin Films By Admittance and Ellipsometry Measurements. 4th International Advances in Applied Physics and Materials Science Congress & Exhibition , (Muğla Fethiye, Turkey).

ÖZDEMİR, O., GÖKDEMİR, F. P., SAATCİ, A. E., & KUTLU, K., (2014). Dielectric Strength of WO3 Thin Films By Admittance and Ellipsometry Measurements . 4th International Advances in Applied Physics and Materials Science Congress & Exhibition, Muğla Fethiye, Turkey

ÖZDEMİR, Orhan Et Al. "Dielectric Strength of WO3 Thin Films By Admittance and Ellipsometry Measurements," 4th International Advances in Applied Physics and Materials Science Congress & Exhibition, Muğla Fethiye, Turkey, 2014

ÖZDEMİR, Orhan Et Al. "Dielectric Strength of WO3 Thin Films By Admittance and Ellipsometry Measurements." 4th International Advances in Applied Physics and Materials Science Congress & Exhibition , Muğla Fethiye, Turkey, 2014

ÖZDEMİR, O. Et Al. (2014) . "Dielectric Strength of WO3 Thin Films By Admittance and Ellipsometry Measurements." 4th International Advances in Applied Physics and Materials Science Congress & Exhibition , Muğla Fethiye, Turkey.

@conferencepaper{conferencepaper, author={Orhan ÖZDEMİR Et Al. }, title={Dielectric Strength of WO3 Thin Films By Admittance and Ellipsometry Measurements}, congress name={4th International Advances in Applied Physics and Materials Science Congress & Exhibition}, city={Muğla Fethiye}, country={Turkey}, year={2014}}