Cetin, M. And BEYHAN, S. 2020. Active fault tolerant control for high-precision positioning of a non-contact mode uncertain atomic force microscopy. Transactions of the Institute of Measurement and Control , vol.42, no.14 , 2632-2644.

Cetin, M., & BEYHAN, S., (2020). Active fault tolerant control for high-precision positioning of a non-contact mode uncertain atomic force microscopy. Transactions of the Institute of Measurement and Control , vol.42, no.14, 2632-2644.

Cetin, Meric, And Selami BEYHAN. "Active fault tolerant control for high-precision positioning of a non-contact mode uncertain atomic force microscopy," Transactions of the Institute of Measurement and Control , vol.42, no.14, 2632-2644, 2020

Cetin, Meric And BEYHAN, Selami. "Active fault tolerant control for high-precision positioning of a non-contact mode uncertain atomic force microscopy." Transactions of the Institute of Measurement and Control , vol.42, no.14, pp.2632-2644, 2020

Cetin, M. And BEYHAN, S. (2020) . "Active fault tolerant control for high-precision positioning of a non-contact mode uncertain atomic force microscopy." Transactions of the Institute of Measurement and Control , vol.42, no.14, pp.2632-2644.

@article{article, author={Meric Cetin And author={Selami BEYHAN}, title={Active fault tolerant control for high-precision positioning of a non-contact mode uncertain atomic force microscopy}, journal={Transactions of the Institute of Measurement and Control}, year=2020, pages={2632-2644} }