SAATCİ, A. E. Et Al. 2013. Electrical characterization of sol-gel derived TiO2 Films on N/P c-Si substrates by admittance measurement . AMWC 2013: Advanced Materials World Congress , (İzmir Çeşme, Turkey).

SAATCİ, A. E., GÖKDEMİR, F. P., ÖZDEMİR, O., & KUTLU, K., (2013). Electrical characterization of sol-gel derived TiO2 Films on N/P c-Si substrates by admittance measurement . AMWC 2013: Advanced Materials World Congress, İzmir Çeşme, Turkey

SAATCİ, Ayşe Et Al. "Electrical characterization of sol-gel derived TiO2 Films on N/P c-Si substrates by admittance measurement ," AMWC 2013: Advanced Materials World Congress, İzmir Çeşme, Turkey, 2013

SAATCİ, Ayşe E. Et Al. "Electrical characterization of sol-gel derived TiO2 Films on N/P c-Si substrates by admittance measurement ." AMWC 2013: Advanced Materials World Congress , İzmir Çeşme, Turkey, 2013

SAATCİ, A. E. Et Al. (2013) . "Electrical characterization of sol-gel derived TiO2 Films on N/P c-Si substrates by admittance measurement ." AMWC 2013: Advanced Materials World Congress , İzmir Çeşme, Turkey.

@conferencepaper{conferencepaper, author={Ayşe Evrim BULGURCUOĞLU Et Al. }, title={Electrical characterization of sol-gel derived TiO2 Films on N/P c-Si substrates by admittance measurement }, congress name={AMWC 2013: Advanced Materials World Congress}, city={İzmir Çeşme}, country={Turkey}, year={2013}}