Serin, M. Et Al. 2012. Oxide Layer Thickness Dependent Electrical Characterization of Al / Al2O3 / CdS MOS Structures. TPS Turkish Physical Society 29th International Physics Congress , (Muğla, Turkey), 607.

Serin, M., Çalışkan, M., & Moğulkoç, M., (2012). Oxide Layer Thickness Dependent Electrical Characterization of Al / Al2O3 / CdS MOS Structures . TPS Turkish Physical Society 29th International Physics Congress (pp.607). Muğla, Turkey

Serin, Merih, Murat ÇALIŞKAN, And Muzaffer Moğulkoç. "Oxide Layer Thickness Dependent Electrical Characterization of Al / Al2O3 / CdS MOS Structures," TPS Turkish Physical Society 29th International Physics Congress, Muğla, Turkey, 2012

Serin, Merih Et Al. "Oxide Layer Thickness Dependent Electrical Characterization of Al / Al2O3 / CdS MOS Structures." TPS Turkish Physical Society 29th International Physics Congress , Muğla, Turkey, pp.607, 2012

Serin, M. Çalışkan, M. And Moğulkoç, M. (2012) . "Oxide Layer Thickness Dependent Electrical Characterization of Al / Al2O3 / CdS MOS Structures." TPS Turkish Physical Society 29th International Physics Congress , Muğla, Turkey, p.607.

@conferencepaper{conferencepaper, author={Merih SERİN Et Al. }, title={Oxide Layer Thickness Dependent Electrical Characterization of Al / Al2O3 / CdS MOS Structures}, congress name={TPS Turkish Physical Society 29th International Physics Congress}, city={Muğla}, country={Turkey}, year={2012}, pages={607} }