Özder, S. Et Al. 1999. Admittance analyis of an MIS structure made with PECVD deposited a-SiNx:H films. JOURNAL OF NON-CRYSTALLINE SOLIDS , vol.249 , 131-144.

Özder, S., ÖZDEMİR, O., & Katırcıoğlu, B., (1999). Admittance analyis of an MIS structure made with PECVD deposited a-SiNx:H films. JOURNAL OF NON-CRYSTALLINE SOLIDS , vol.249, 131-144.

Özder, Serhat, Orhan ÖZDEMİR, And Bayram Katırcıoğlu. "Admittance analyis of an MIS structure made with PECVD deposited a-SiNx:H films," JOURNAL OF NON-CRYSTALLINE SOLIDS , vol.249, 131-144, 1999

Özder, Serhat Et Al. "Admittance analyis of an MIS structure made with PECVD deposited a-SiNx:H films." JOURNAL OF NON-CRYSTALLINE SOLIDS , vol.249, pp.131-144, 1999

Özder, S. ÖZDEMİR, O. And Katırcıoğlu, B. (1999) . "Admittance analyis of an MIS structure made with PECVD deposited a-SiNx:H films." JOURNAL OF NON-CRYSTALLINE SOLIDS , vol.249, pp.131-144.

@article{article, author={Serhat Özder Et Al. }, title={Admittance analyis of an MIS structure made with PECVD deposited a-SiNx:H films}, journal={JOURNAL OF NON-CRYSTALLINE SOLIDS}, year=1999, pages={131-144} }