Saatci, A. E. And ÖZDEMİR, O. 2014. Electrical Characterization of Sol-Gel Derived TiO2 Film on c-Si Substrate by Admittance Measurement. ADVANCES IN MATERIALS SCIENCE AND ENGINEERING .

Saatci, A. E., & ÖZDEMİR, O., (2014). Electrical Characterization of Sol-Gel Derived TiO2 Film on c-Si Substrate by Admittance Measurement. ADVANCES IN MATERIALS SCIENCE AND ENGINEERING .

Saatci, Ayşe, And Orhan ÖZDEMİR. "Electrical Characterization of Sol-Gel Derived TiO2 Film on c-Si Substrate by Admittance Measurement," ADVANCES IN MATERIALS SCIENCE AND ENGINEERING , 2014

Saatci, Ayşe E. And ÖZDEMİR, Orhan. "Electrical Characterization of Sol-Gel Derived TiO2 Film on c-Si Substrate by Admittance Measurement." ADVANCES IN MATERIALS SCIENCE AND ENGINEERING , 2014

Saatci, A. E. And ÖZDEMİR, O. (2014) . "Electrical Characterization of Sol-Gel Derived TiO2 Film on c-Si Substrate by Admittance Measurement." ADVANCES IN MATERIALS SCIENCE AND ENGINEERING .

@article{article, author={Ayşe Evrim BULGURCUOĞLU And author={Orhan ÖZDEMİR}, title={Electrical Characterization of Sol-Gel Derived TiO2 Film on c-Si Substrate by Admittance Measurement}, journal={ADVANCES IN MATERIALS SCIENCE AND ENGINEERING}, year=2014}