ÖZDEMİR, O. Et Al. 2006. Frequency dependence of conductivity in intrinsic amorphous silicon carbide film, assessed through admittance measurement of metal insulator semiconductor structure. THIN SOLID FILMS , vol.497 , 149-156.

ÖZDEMİR, O., Atılgan, İ., Akaoğlu, B., Sel, K., & Katırcıoğlu, B., (2006). Frequency dependence of conductivity in intrinsic amorphous silicon carbide film, assessed through admittance measurement of metal insulator semiconductor structure. THIN SOLID FILMS , vol.497, 149-156.

ÖZDEMİR, Orhan Et Al. "Frequency dependence of conductivity in intrinsic amorphous silicon carbide film, assessed through admittance measurement of metal insulator semiconductor structure," THIN SOLID FILMS , vol.497, 149-156, 2006

ÖZDEMİR, Orhan Et Al. "Frequency dependence of conductivity in intrinsic amorphous silicon carbide film, assessed through admittance measurement of metal insulator semiconductor structure." THIN SOLID FILMS , vol.497, pp.149-156, 2006

ÖZDEMİR, O. Et Al. (2006) . "Frequency dependence of conductivity in intrinsic amorphous silicon carbide film, assessed through admittance measurement of metal insulator semiconductor structure." THIN SOLID FILMS , vol.497, pp.149-156.

@article{article, author={Orhan ÖZDEMİR Et Al. }, title={Frequency dependence of conductivity in intrinsic amorphous silicon carbide film, assessed through admittance measurement of metal insulator semiconductor structure}, journal={THIN SOLID FILMS}, year=2006, pages={149-156} }