YEŞİLKAYA, S. S. 1999. The Basic Principles of the Transmission Electron Microscope and Analysis of Structural Defects in GaN by High Resolution Electron Microscopy. Summer School and Workshop on the Physics of Materials, Thessaloniki, Greece. , 33-39.

YEŞİLKAYA, S. S., (1999). The Basic Principles of the Transmission Electron Microscope and Analysis of Structural Defects in GaN by High Resolution Electron Microscopy . Summer School and Workshop on the Physics of Materials, Thessaloniki, Greece. (pp.33-39).

YEŞİLKAYA, Serço. "The Basic Principles of the Transmission Electron Microscope and Analysis of Structural Defects in GaN by High Resolution Electron Microscopy," Summer School and Workshop on the Physics of Materials, Thessaloniki, Greece., 1999

YEŞİLKAYA, Serço S. . "The Basic Principles of the Transmission Electron Microscope and Analysis of Structural Defects in GaN by High Resolution Electron Microscopy." Summer School and Workshop on the Physics of Materials, Thessaloniki, Greece. , pp.33-39, 1999

YEŞİLKAYA, S. S. (1999) . "The Basic Principles of the Transmission Electron Microscope and Analysis of Structural Defects in GaN by High Resolution Electron Microscopy." Summer School and Workshop on the Physics of Materials, Thessaloniki, Greece. , pp.33-39.

@conferencepaper{conferencepaper, author={Serço Serkis YEŞİLKAYA}, title={The Basic Principles of the Transmission Electron Microscope and Analysis of Structural Defects in GaN by High Resolution Electron Microscopy}, congress name={Summer School and Workshop on the Physics of Materials, Thessaloniki, Greece.}, city={}, country={}, year={1999}, pages={33-39} }