O. ÖZDEMİR, "Investigation of carbon rich a-SiCx:H film through MIS and MIM structures by DLTS and admittance measurements," 0
ÖZDEMİR, O. Investigation of carbon rich a-SiCx:H film through MIS and MIM structures by DLTS and admittance measurements. .
ÖZDEMİR, O., Investigation of carbon rich a-SiCx:H film through MIS and MIM structures by DLTS and admittance measurements .
ÖZDEMİR, Orhan. "Investigation of carbon rich a-SiCx:H film through MIS and MIM structures by DLTS and admittance measurements,"
ÖZDEMİR, Orhan. "Investigation of carbon rich a-SiCx:H film through MIS and MIM structures by DLTS and admittance measurements."
ÖZDEMİR, O. . "Investigation of carbon rich a-SiCx:H film through MIS and MIM structures by DLTS and admittance measurements." .
@conferencepaper{conferencepaper, author={Orhan ÖZDEMİR}, title={Investigation of carbon rich a-SiCx:H film through MIS and MIM structures by DLTS and admittance measurements}, congress name={}, city={}, country={}, year={0}}