ÖZDEMİR, O. Investigation of carbon rich a-SiCx:H film through MIS and MIM structures by DLTS and admittance measurements. .

ÖZDEMİR, O., Investigation of carbon rich a-SiCx:H film through MIS and MIM structures by DLTS and admittance measurements .

ÖZDEMİR, Orhan. "Investigation of carbon rich a-SiCx:H film through MIS and MIM structures by DLTS and admittance measurements,"

ÖZDEMİR, Orhan. "Investigation of carbon rich a-SiCx:H film through MIS and MIM structures by DLTS and admittance measurements."

ÖZDEMİR, O. . "Investigation of carbon rich a-SiCx:H film through MIS and MIM structures by DLTS and admittance measurements." .

@conferencepaper{conferencepaper, author={Orhan ÖZDEMİR}, title={Investigation of carbon rich a-SiCx:H film through MIS and MIM structures by DLTS and admittance measurements}, congress name={}, city={}, country={}, year={0}}