Yamuç, A. Et Al. 2017. Solving Test Suite Reduction Problem Using Greedy and Genetic Algorithms. 9th INTERNATIONAL CONFERENCE on ELECTRONICS, COMPUTERS and ARTIFICIAL INTELLIGENCE , (Targoviste, Romania), 1-5.

Yamuç, A., CİNGİZ, M. Ö., BİRİCİK, G., & KALIPSIZ, O., (2017). Solving Test Suite Reduction Problem Using Greedy and Genetic Algorithms . 9th INTERNATIONAL CONFERENCE on ELECTRONICS, COMPUTERS and ARTIFICIAL INTELLIGENCE (pp.1-5). Targoviste, Romania

Yamuç, Ali Et Al. "Solving Test Suite Reduction Problem Using Greedy and Genetic Algorithms," 9th INTERNATIONAL CONFERENCE on ELECTRONICS, COMPUTERS and ARTIFICIAL INTELLIGENCE, Targoviste, Romania, 2017

Yamuç, Ali Et Al. "Solving Test Suite Reduction Problem Using Greedy and Genetic Algorithms." 9th INTERNATIONAL CONFERENCE on ELECTRONICS, COMPUTERS and ARTIFICIAL INTELLIGENCE , Targoviste, Romania, pp.1-5, 2017

Yamuç, A. Et Al. (2017) . "Solving Test Suite Reduction Problem Using Greedy and Genetic Algorithms." 9th INTERNATIONAL CONFERENCE on ELECTRONICS, COMPUTERS and ARTIFICIAL INTELLIGENCE , Targoviste, Romania, pp.1-5.

@conferencepaper{conferencepaper, author={Ali YAMUÇ Et Al. }, title={Solving Test Suite Reduction Problem Using Greedy and Genetic Algorithms}, congress name={9th INTERNATIONAL CONFERENCE on ELECTRONICS, COMPUTERS and ARTIFICIAL INTELLIGENCE}, city={Targoviste}, country={Romania}, year={2017}, pages={1-5} }