Guney, A. Et Al. 2020. Experimental and modeling studies of automotive-qualified OLEDs under electrical stress. MICROELECTRONICS RELIABILITY , vol.111 .

Guney, A., Yelten, M. B., Ferhanoğlu, O., & KAHRAMAN, N., (2020). Experimental and modeling studies of automotive-qualified OLEDs under electrical stress. MICROELECTRONICS RELIABILITY , vol.111.

Guney, Arda Et Al. "Experimental and modeling studies of automotive-qualified OLEDs under electrical stress," MICROELECTRONICS RELIABILITY , vol.111, 2020

Guney, Arda Et Al. "Experimental and modeling studies of automotive-qualified OLEDs under electrical stress." MICROELECTRONICS RELIABILITY , vol.111, 2020

Guney, A. Et Al. (2020) . "Experimental and modeling studies of automotive-qualified OLEDs under electrical stress." MICROELECTRONICS RELIABILITY , vol.111.

@article{article, author={Arda GÜNEY Et Al. }, title={Experimental and modeling studies of automotive-qualified OLEDs under electrical stress}, journal={MICROELECTRONICS RELIABILITY}, year=2020}