ORUÇ, Ç. Et Al. 2016. Characterization of Metal Ag Au Pc thin film Semiconductor Structures by Impedance Spectroscopy Technique. Science & Applications of Thin Films, Conference & Exhibition SATF 2016 .

ORUÇ, Ç., Erkol, A., & ALTINDAL, A., (2016). Characterization of Metal Ag Au Pc thin film Semiconductor Structures by Impedance Spectroscopy Technique . Science & Applications of Thin Films, Conference & Exhibition SATF 2016

ORUÇ, Çiğdem, Arden Erkol, And Ahmet ALTINDAL. "Characterization of Metal Ag Au Pc thin film Semiconductor Structures by Impedance Spectroscopy Technique," Science & Applications of Thin Films, Conference & Exhibition SATF 2016, 2016

ORUÇ, Çiğdem Et Al. "Characterization of Metal Ag Au Pc thin film Semiconductor Structures by Impedance Spectroscopy Technique." Science & Applications of Thin Films, Conference & Exhibition SATF 2016 , 2016

ORUÇ, Ç. Erkol, A. And ALTINDAL, A. (2016) . "Characterization of Metal Ag Au Pc thin film Semiconductor Structures by Impedance Spectroscopy Technique." Science & Applications of Thin Films, Conference & Exhibition SATF 2016 .

@conferencepaper{conferencepaper, author={Çiğdem ORUÇ Et Al. }, title={Characterization of Metal Ag Au Pc thin film Semiconductor Structures by Impedance Spectroscopy Technique}, congress name={Science & Applications of Thin Films, Conference & Exhibition SATF 2016}, city={}, country={}, year={2016}}