PEHLİVAN, Ö. Et Al. 2015. Study of the a-Si:H/c-Si Heterointerface by Ex-Situ Spectroscopic Ellipsometry, Infrared Spectroscopy, and Solar Cell Modeling. CHINESE JOURNAL OF PHYSICS , vol.53, no.3 .

PEHLİVAN, Ö., KARATAŞ, S., YILMAZ, O., KODOLBAŞ , A. O., DUYGULU, Ö., DUYGULU, N., ... Iskender, I.(2015). Study of the a-Si:H/c-Si Heterointerface by Ex-Situ Spectroscopic Ellipsometry, Infrared Spectroscopy, and Solar Cell Modeling. CHINESE JOURNAL OF PHYSICS , vol.53, no.3.

PEHLİVAN, ÖZLEM Et Al. "Study of the a-Si:H/c-Si Heterointerface by Ex-Situ Spectroscopic Ellipsometry, Infrared Spectroscopy, and Solar Cell Modeling," CHINESE JOURNAL OF PHYSICS , vol.53, no.3, 2015

PEHLİVAN, ÖZLEM Et Al. "Study of the a-Si:H/c-Si Heterointerface by Ex-Situ Spectroscopic Ellipsometry, Infrared Spectroscopy, and Solar Cell Modeling." CHINESE JOURNAL OF PHYSICS , vol.53, no.3, 2015

PEHLİVAN, Ö. Et Al. (2015) . "Study of the a-Si:H/c-Si Heterointerface by Ex-Situ Spectroscopic Ellipsometry, Infrared Spectroscopy, and Solar Cell Modeling." CHINESE JOURNAL OF PHYSICS , vol.53, no.3.

@article{article, author={ÖZLEM PEHLİVAN Et Al. }, title={Study of the a-Si:H/c-Si Heterointerface by Ex-Situ Spectroscopic Ellipsometry, Infrared Spectroscopy, and Solar Cell Modeling}, journal={CHINESE JOURNAL OF PHYSICS}, year=2015}