ÖZDEMİR, O. Et Al. 2008. Conduction mechanism analysis in beta-FeSi2/n-Si heterojunction through J-V-T measurement. SEMICONDUCTOR SCIENCE AND TECHNOLOGY , vol.23, no.9 .

ÖZDEMİR, O., Tatar, B., Yilmazer, D., Gokdemir, P., & Kutlu, K., (2008). Conduction mechanism analysis in beta-FeSi2/n-Si heterojunction through J-V-T measurement. SEMICONDUCTOR SCIENCE AND TECHNOLOGY , vol.23, no.9.

ÖZDEMİR, Orhan Et Al. "Conduction mechanism analysis in beta-FeSi2/n-Si heterojunction through J-V-T measurement," SEMICONDUCTOR SCIENCE AND TECHNOLOGY , vol.23, no.9, 2008

ÖZDEMİR, Orhan Et Al. "Conduction mechanism analysis in beta-FeSi2/n-Si heterojunction through J-V-T measurement." SEMICONDUCTOR SCIENCE AND TECHNOLOGY , vol.23, no.9, 2008

ÖZDEMİR, O. Et Al. (2008) . "Conduction mechanism analysis in beta-FeSi2/n-Si heterojunction through J-V-T measurement." SEMICONDUCTOR SCIENCE AND TECHNOLOGY , vol.23, no.9.

@article{article, author={Orhan ÖZDEMİR Et Al. }, title={Conduction mechanism analysis in beta-FeSi2/n-Si heterojunction through J-V-T measurement}, journal={SEMICONDUCTOR SCIENCE AND TECHNOLOGY}, year=2008}