ÖZDEMİR, O. Et Al. 2008. Conduction Mechanism Analysis in beta-FeSi2/n-Si heterojuction Through J-V-T Measurement. Semiconductor Science and Technology , vol.23 .

ÖZDEMİR, O., Tatar, B., Yılmazer, D., Gökdemir, P., & Kutlu, K., (2008). Conduction Mechanism Analysis in beta-FeSi2/n-Si heterojuction Through J-V-T Measurement. Semiconductor Science and Technology , vol.23.

ÖZDEMİR, Orhan Et Al. "Conduction Mechanism Analysis in beta-FeSi2/n-Si heterojuction Through J-V-T Measurement," Semiconductor Science and Technology , vol.23, 2008

ÖZDEMİR, Orhan Et Al. "Conduction Mechanism Analysis in beta-FeSi2/n-Si heterojuction Through J-V-T Measurement." Semiconductor Science and Technology , vol.23, 2008

ÖZDEMİR, O. Et Al. (2008) . "Conduction Mechanism Analysis in beta-FeSi2/n-Si heterojuction Through J-V-T Measurement." Semiconductor Science and Technology , vol.23.

@article{article, author={Orhan ÖZDEMİR Et Al. }, title={Conduction Mechanism Analysis in beta-FeSi2/n-Si heterojuction Through J-V-T Measurement}, journal={Semiconductor Science and Technology}, year=2008}