Serin, M. Et Al. 2003. Investigation of the transport properties of microcrystalline silicon by time-of-flight (TOF). JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , vol.14 , 733-734.

Serin, M., Harder, N., & Carıus, R., (2003). Investigation of the transport properties of microcrystalline silicon by time-of-flight (TOF). JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , vol.14, 733-734.

Serin, Merih, N Harder, And R Carıus. "Investigation of the transport properties of microcrystalline silicon by time-of-flight (TOF)," JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , vol.14, 733-734, 2003

Serin, Merih Et Al. "Investigation of the transport properties of microcrystalline silicon by time-of-flight (TOF)." JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , vol.14, pp.733-734, 2003

Serin, M. Harder, N. And Carıus, R. (2003) . "Investigation of the transport properties of microcrystalline silicon by time-of-flight (TOF)." JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , vol.14, pp.733-734.

@article{article, author={Merih SERİN Et Al. }, title={Investigation of the transport properties of microcrystalline silicon by time-of-flight (TOF)}, journal={JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS}, year=2003, pages={733-734} }