T. KIYAN Et Al. , "Timing Characterization of a Tester Operated Integrated Circuit by Continuous and Pulsed Laser Stimulation," International Symposium for Testing and Failure Analysis (ISTFA) , 2010
KIYAN, T. Et Al. 2010. Timing Characterization of a Tester Operated Integrated Circuit by Continuous and Pulsed Laser Stimulation. International Symposium for Testing and Failure Analysis (ISTFA) .
KIYAN, T., BRILLERT, C., & BOIT, C., (2010). Timing Characterization of a Tester Operated Integrated Circuit by Continuous and Pulsed Laser Stimulation . International Symposium for Testing and Failure Analysis (ISTFA)
KIYAN, Tuba, CHRISTOF BRILLERT, And CHRISTIAN BOIT. "Timing Characterization of a Tester Operated Integrated Circuit by Continuous and Pulsed Laser Stimulation," International Symposium for Testing and Failure Analysis (ISTFA), 2010
KIYAN, Tuba Et Al. "Timing Characterization of a Tester Operated Integrated Circuit by Continuous and Pulsed Laser Stimulation." International Symposium for Testing and Failure Analysis (ISTFA) , 2010
KIYAN, T. BRILLERT, C. And BOIT, C. (2010) . "Timing Characterization of a Tester Operated Integrated Circuit by Continuous and Pulsed Laser Stimulation." International Symposium for Testing and Failure Analysis (ISTFA) .
@conferencepaper{conferencepaper, author={Tuba KIYAN Et Al. }, title={Timing Characterization of a Tester Operated Integrated Circuit by Continuous and Pulsed Laser Stimulation}, congress name={International Symposium for Testing and Failure Analysis (ISTFA)}, city={}, country={}, year={2010}}