Signal-noise support vector model of a microwave transistor


Guenes F., Tuerker N. , Guergen F.

INTERNATIONAL JOURNAL OF RF AND MICROWAVE COMPUTER-AIDED ENGINEERING, vol.17, no.4, pp.404-415, 2007 (Journal Indexed in SCI) identifier identifier

  • Publication Type: Article / Article
  • Volume: 17 Issue: 4
  • Publication Date: 2007
  • Doi Number: 10.1002/mmce.20239
  • Title of Journal : INTERNATIONAL JOURNAL OF RF AND MICROWAVE COMPUTER-AIDED ENGINEERING
  • Page Numbers: pp.404-415

Abstract

In this work, a support vector machines (SVM) model for the small-signal and noise behaviors of a microwave transistor is presented and compared with its artificial neural network (ANN) model. Convex optimization and generalization properties of SVM are applied to the black-box modeling of a microwave transistor. It has been shown that SVM has a high potential of accurate and efficient device modeling. This is verified by giving a worked example as compared with ANN which is another commonly used modeling technique. It can be concluded that hereafter SVM modeling is a strongly competitive approach against ANN modeling.