An approach to the integrated analysis of technology trends with patentometrics Patentometri ile teknoloji trendlerinin bütünleşik analizine yönelik bir yaklaşım


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ALTUNTAŞ S., Kansu S.

Journal of the Faculty of Engineering and Architecture of Gazi University, cilt.41, sa.2, ss.1063-1077, 2026 (SCI-Expanded, Scopus, TRDizin)

Özet

Patentometrics provides a crucial roadmap for investing in technologies, strengthening companies' strategic decision-making processes. Patent data serves as a valuable resource that companies can utilize to determine technology intelligence and technology trends. Identifying technological trends through patentometrics, which is based on the data-driven analysis of patent data, is of great importance. This study proposes an integrated approach to analyzing technology trends using patent data with the K-means, Entropy-based VIKOR, and ARIMA models. The effectiveness of the proposed approach has been tested using patent data related to supply chain technologies. Within the scope of the study, 32,578 patent records granted over the past 20 years in the "lens.org" database were utilized. The results of the application have shown that the clusters "Machine Learning and Cognitive Systems," "Network Security and Blockchain," and "RFID and Identification Systems" exhibit the highest quality. Additionally, the number of patents in these clusters is projected to increase over the next five years. By increasing R&D investments in these technologies and integrating them into business processes, companies can gain a competitive advantage.