Instability evolution within a-SiNx film assessed through MIS structure under bias and temperature stresses,", J. Non-cryst. Sol., 296, 27-38, 2001. | AVESİS

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Instability evolution within a-SiNx film assessed through MIS structure under bias and temperature stresses,", J. Non-cryst. Sol., 296, 27-38, 2001.

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ÖZDEMİR O., Atılgan i., Katırcıoğlu B.

JOURNAL OF NON-CRYSTALLINE SOLIDS, vol.296, pp.27-38, 2001 (SCI-Expanded)

Publication Type: Article / Article
Volume: 296
Publication Date: 2001
Journal Name: JOURNAL OF NON-CRYSTALLINE SOLIDS
Journal Indexes: Science Citation Index Expanded (SCI-EXPANDED), Scopus
Page Numbers: pp.27-38
Yıldız Technical University Affiliated: Yes