Modeling and Performance Analysis of the IEEE 802.11 MAC for VANETs under Capture Effect


Shah A. S., İlhan H., Türeli M. S. U.

IEEE Wireless and Microwave Technology Conference (WAMICON), Florida, United States Of America, 8 - 09 April 2019, pp.1-5, (Full Text)

  • Publication Type: Conference Paper / Full Text
  • Doi Number: 10.1109/wamicon.2019.8765446
  • City: Florida
  • Country: United States Of America
  • Page Numbers: pp.1-5
  • Yıldız Technical University Affiliated: Yes