AC Dielectric Spectroscopy of Multilayer Thin Film Dependency on Cr Thickness
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OKUTAN M.
Ulusal Nanobilim ve Nanoteknoloji Konferansı (NanoTR5) 08-12 Haziran 2009., 01 June 2009
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Publication Type:
Conference Paper / Full Text
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Yıldız Technical University Affiliated:
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