AC Dielectric Spectroscopy of Multilayer Thin Film Dependency on Cr Thickness


OKUTAN M.

Ulusal Nanobilim ve Nanoteknoloji Konferansı (NanoTR5) 08-12 Haziran 2009., 01 June 2009

  • Publication Type: Conference Paper / Full Text
  • Yıldız Technical University Affiliated: No