Akademik Veri Yönetim Sistemi
TURKISH PHYSICAL SOCIETY 40TH INTERNATIONAL PHYSICS CONGRESS, Muğla, Türkiye, 2 - 06 Eylül 2024, cilt.1, sa.1, ss.336, (Özet Bildiri)
This study presents the development of an advanced X-ray fluorescence (XRF) system designed to automate the control of critical parameters, including the X-ray tube, detector positioning, required angles, source-sample distance, and sample detector distance. By integrating these components into a computer-controlled system, this study aims to significantly enhance the precision, efficiency, and repeatability of XRF measurements. Although the process seems basic to apply, adjustment of the experiment setup and keeping the measurement conditions stable cost much time and meticulous labor. In this study; design, development and production of an automated XRF spectroscopy device is proposed. Components of the proposed system are fabricated by 3D printer. The proposed system offers researchers the ability to conduct experiments with improved accuracy, minimizing manual errors and reducing the time required for setup and data collection. The automated control allows for a more streamlined workflow, enabling researchers to focus on data interpretation rather than instrument manipulation. Furthermore, the system's adaptability makes it suitable for a wide range of applications in material science, chemistry, and related fields. Future work will involve the integration of AI-supported software, which is expected to further refine the system's capabilities by optimizing operational parameters and providing intelligent data analysis. This development represents a substantial advancement in XRF technology, offering a powerful tool for researchers seeking to achieve high-precision results in their experimental work.