Quantification of scattering from fiber surface irregularities

Avram E., Mahmood W., ÖZER M.

JOURNAL OF LIGHTWAVE TECHNOLOGY, cilt.20, sa.4, ss.634-637, 2002 (SCI-Expanded) identifier identifier

  • Yayın Türü: Makale / Tam Makale
  • Cilt numarası: 20 Sayı: 4
  • Basım Tarihi: 2002
  • Doi Numarası: 10.1109/50.996583
  • Dergi Adı: JOURNAL OF LIGHTWAVE TECHNOLOGY
  • Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Sayfa Sayıları: ss.634-637
  • Yıldız Teknik Üniversitesi Adresli: Hayır

Özet

A quantitative description of the effects of fiber endface defects such as scratches and digs does not exist in the literature. We show, by considering surface scattering from the fiber endface, that such a description can be given in terms of a single parameter, which is a measure of the increase in backscattering due to the defect. We present our results in terms of some assumed values of this parameter.