Low-resistance GaN tunnel homojunctions with 150 kA/cm(2) current and repeatable negative differential resistance

Akyol, Fatih; Krishnamoorthy, Sriram; Zhang, Yuewei; Johnson, Jared; Hwang, Jinwoo; Rajan, Siddharth

doi:10.1063/1.4944998

Low-resistance GaN tunnel homojunctions with 150 kA/cm(2) current and repeatable negative differential resistance

Akyol F., Krishnamoorthy S., Zhang Y., Johnson J., Hwang J., Rajan S.

APPLIED PHYSICS LETTERS, cilt.108, sa.13, 2016 (SCI-Expanded, Scopus)

Yayın Türü: Makale / Tam Makale
Cilt numarası: 108 Sayı: 13
Basım Tarihi: 2016
Doi Numarası: 10.1063/1.4944998
Dergi Adı: APPLIED PHYSICS LETTERS
Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus
Açık Arşiv Koleksiyonu: AVESİS Açık Erişim Koleksiyonu
Yıldız Teknik Üniversitesi Adresli: Hayır

Özet

We report GaN n++/p++ interband tunnel junctions with repeatable negative differential resistance and low resistance. Reverse and forward tunneling current densities were observed to increase as Si and Mg doping concentrations were increased. Hysteresis-free, bidirectional negative differential resistance was observed at room temperature from these junctions at a forward voltage similar to 1.6V. Thermionic PN junctions with GaN homojunction tunnel contact to the p-layer exhibited forward current density of 150 kA/cm(2) at 7.6V, with a low series device resistance of 1 x 10(-5) Omega cm(2). (C) 2016 AIP Publishing LLC.