Detailed study on effects of gate voltage, frequency and temperature on dielectric properties of Cu/PAr/n-CdS/SnO2 MIS Schottky diode

Kuruoğlu F., Çalışkan M., Yıldırım S., Serin M.

Journal Of Physics D-Applied Physics, cilt.54, ss.145102-145109, 2021 (SCI-Expanded)

  • Yayın Türü: Makale / Tam Makale
  • Cilt numarası: 54
  • Basım Tarihi: 2021
  • Doi Numarası: 10.1088/1361-6463/abd80e
  • Dergi Adı: Journal Of Physics D-Applied Physics
  • Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus, Academic Search Premier, Aerospace Database, Applied Science & Technology Source, Chemical Abstracts Core, Communication Abstracts, Compendex, Computer & Applied Sciences, INSPEC, Metadex, Civil Engineering Abstracts
  • Sayfa Sayıları: ss.145102-145109
  • Yıldız Teknik Üniversitesi Adresli: Evet