Design of optimum component test plans in the demonstration of diverse system performance measures
IIE Transactions (Institute of Industrial Engineers), cilt.43, sa.7, ss.535-546, 2011 (SCI-Expanded, Scopus)
- Yayın Türü: Makale / Tam Makale
- Cilt numarası: 43 Sayı: 7
- Basım Tarihi: 2011
- Doi Numarası: 10.1080/0740817x.2010.523768
- Dergi Adı: IIE Transactions (Institute of Industrial Engineers)
- Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus
- Sayfa Sayıları: ss.535-546
- Anahtar Kelimeler: Availability, Column generation, Component testing, Mean-time-to-failure, Semi-infinite linear programming
- Yıldız Teknik Üniversitesi Adresli: Evet
Özet
While component-level tests have many advantages over system-level tests, the actual protection offered in making inferences about system reliability is not the same as what is expected. Thus, a significant proportion of research has concentrated on the design of system-based component test plans that also have minimum cost. This article extends those previous studies by considering two additional system performance measures: expected system lifetime and system availability. After explicitly expressing these performance measures as a function of failure rates for various system types, the component testing problem is formulated as a semi-infinite linear programming problem and solved with a column generation technique incorporating signomial geometric programming. Several numerical examples are presented that provide insight on the model parameters. Copyright © "IIE".