Design of optimum component test plans in the demonstration of diverse system performance measures

Yamangil E., Altnel I. K., ÇEKYAY B., FEYZİOĞLU O., Özekici S.

IIE Transactions (Institute of Industrial Engineers), vol.43, no.7, pp.535-546, 2011 (SCI-Expanded) identifier

  • Publication Type: Article / Article
  • Volume: 43 Issue: 7
  • Publication Date: 2011
  • Doi Number: 10.1080/0740817x.2010.523768
  • Journal Name: IIE Transactions (Institute of Industrial Engineers)
  • Journal Indexes: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Page Numbers: pp.535-546
  • Keywords: Availability, Column generation, Component testing, Mean-time-to-failure, Semi-infinite linear programming
  • Yıldız Technical University Affiliated: Yes

Abstract

While component-level tests have many advantages over system-level tests, the actual protection offered in making inferences about system reliability is not the same as what is expected. Thus, a significant proportion of research has concentrated on the design of system-based component test plans that also have minimum cost. This article extends those previous studies by considering two additional system performance measures: expected system lifetime and system availability. After explicitly expressing these performance measures as a function of failure rates for various system types, the component testing problem is formulated as a semi-infinite linear programming problem and solved with a column generation technique incorporating signomial geometric programming. Several numerical examples are presented that provide insight on the model parameters. Copyright © "IIE".