Surface scratch and pit analysis on optical interfaces


Mahmood W., Ozer M. , Avram E.

Conference on Active and Passive Optical Components for WDM Communication, Colorado, United States Of America, 21 - 24 August 2001, vol.4532, pp.323-329 identifier identifier

  • Publication Type: Conference Paper / Full Text
  • Volume: 4532
  • Doi Number: 10.1117/12.436025
  • City: Colorado
  • Country: United States Of America
  • Page Numbers: pp.323-329

Abstract

It is shown that fiber surface performance degradation due to scratches and pits can be analysed using wave scattering by imperfect surfaces. The return loss of a fiber endface/interface is obtained in terms of a parameter which gives the relative increase in scattering due to a defect over a defectless fiber endface. This parameter can be expressed as the ratio of the bidirectional scatter distribution functions with and without the defect. The predicted return losses as a function of the ratios mentioned above are presented.