Surface scratch and pit analysis on optical interfaces

Mahmood W., Ozer M. , Avram E.

Conference on Active and Passive Optical Components for WDM Communication, Colorado, Amerika Birleşik Devletleri, 21 - 24 Ağustos 2001, cilt.4532, ss.323-329 identifier identifier

  • Yayın Türü: Bildiri / Tam Metin Bildiri
  • Cilt numarası: 4532
  • Doi Numarası: 10.1117/12.436025
  • Basıldığı Şehir: Colorado
  • Basıldığı Ülke: Amerika Birleşik Devletleri
  • Sayfa Sayıları: ss.323-329


It is shown that fiber surface performance degradation due to scratches and pits can be analysed using wave scattering by imperfect surfaces. The return loss of a fiber endface/interface is obtained in terms of a parameter which gives the relative increase in scattering due to a defect over a defectless fiber endface. This parameter can be expressed as the ratio of the bidirectional scatter distribution functions with and without the defect. The predicted return losses as a function of the ratios mentioned above are presented.