Similar admittance behavior of amorphous silicon carbide and nitride dielectrics within the MIS structure


ÖZDEMİR O., Atılgan İ., Katırcıoğlu B.

Vacuum, vol.82, no.6, pp.566-573, 2008 (SCI-Expanded)

  • Publication Type: Article / Article
  • Volume: 82 Issue: 6
  • Publication Date: 2008
  • Journal Name: Vacuum
  • Journal Indexes: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Page Numbers: pp.566-573
  • Yıldız Technical University Affiliated: Yes