Technology acceptance model has been researched with many different external variables in the literature. One of the external variables of technology acceptance model is resistance. In present study, we aim to investigate the association between resistance and exogenous variables of technology acceptance model (perceived ease of use and perceived usefulness), on the basis of the findings of prior researches. We achieved 41 papers, which are indexed in SCOPUS database, have correlation scores between resistance and each variable of technology acceptance model. Then we used correlation scores and sample sizes reported in the papers and we conducted meta-analyses with Comprehensive Meta Analysis program. Publication bias was checked first, and no publication bias was found. After that we applied fixed and random effect models to the data and we found that random effect model was appropriate. Results of the analyses showed that average effect size of resistance and perceived ease of use was negative and small level ((r) over bar = -0,225, p = 0.00). Similarly, average effect size of resistance and perceived usefulness was negative and small level ((r) over bar = -0,238, p = 0.00) in this study. So we reached general conclusion about the association between resistance and exogenous variables of technology acceptance model in present study.