Structural, surface morphological and dielectric studies of FeGe alloys grown using electron beam deposition

Gürbüz O., Okutan M., Bolivar P. H.

Ferroelectrics, cilt.602, sa.1, ss.60-70, 2023 (SCI-Expanded) identifier

  • Yayın Türü: Makale / Tam Makale
  • Cilt numarası: 602 Sayı: 1
  • Basım Tarihi: 2023
  • Doi Numarası: 10.1080/00150193.2022.2149302
  • Dergi Adı: Ferroelectrics
  • Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Sayfa Sayıları: ss.60-70
  • Anahtar Kelimeler: AC conductivity, dielectric parameters, Fe-Ge thin films, loss tangent
  • Yıldız Teknik Üniversitesi Adresli: Hayır

Özet

FeGe alloys were accumulated on the Si substrates using the electron beam deposition technique. XRD technique was used to analyze the dependence of the crystal and phase of FeGe alloys. By applying Scherrer’s method, the theoretically calculated crystallite dimension comparisons were performed. Depending on the concentration of increasing Ge, the size of the crystalline increases from 44.8 to 51.8 nm. The morphology and grain size changes of the alloys were compared with SEM in terms of their surface distribution. Dielectric properties, tangent loss, and AC conductivity (σ ac) were demonstrated depending on the frequency.