Cobalt-titanium multilayer thin films: Effect of thickness of titanium spacer layer on impedance properties


Sentürk E., Erkovan M., Okutan M. , Kösemen A., Öztürk S., Şahin Y.

Materials Science in Semiconductor Processing, vol.30, pp.482-485, 2015 (Journal Indexed in SCI) identifier identifier

  • Publication Type: Article / Article
  • Volume: 30
  • Publication Date: 2015
  • Doi Number: 10.1016/j.mssp.2014.10.053
  • Title of Journal : Materials Science in Semiconductor Processing
  • Page Numbers: pp.482-485