Humidity-voltaic characteristics of Au-porous silicon interfaces
JOURNAL OF PHYSICS D-APPLIED PHYSICS, cilt.37, sa.3, ss.404-408, 2004 (SCI-Expanded, Scopus)
- Yayın Türü: Makale / Tam Makale
- Cilt numarası: 37 Sayı: 3
- Basım Tarihi: 2004
- Doi Numarası: 10.1088/0022-3727/37/3/016
- Dergi Adı: JOURNAL OF PHYSICS D-APPLIED PHYSICS
- Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus
- Sayfa Sayıları: ss.404-408
- Yıldız Teknik Üniversitesi Adresli: Evet
Özet
The humidity-voltaic effect, i.e. generation of open-circuit voltage (V,,c), in Au-porous silicon (PS) interface in humid atmosphere (up to 450 mV at 95% relative humidity) in dark and daylight illumination is discovered. The humidity-stimulated voltage generation is attributed to the splitting of water and hydrogen molecules on the surfaces of the Au catalyst, where further diffusion penetration of hydrogen ions into the Au-PS interface results in the formation of dipoles, thus inducing V-oc across dipoles. The generation of Voc (up to 550 mV) has also been observed on dipping of Au-PS structures in different hydrogen-containing solutions (ethanol, benzine, sodium tetraborate pentahydrate, etc). Data of response time-dependent changes of the open-circuit voltage generated in Au-PS structures under humid conditions were used for the estimation of diffusion coefficients of hydrogen. The temperature dependence of the diffusion coefficient of hydrogen at 323-353 K via the pore surfaces of PS is attributed to be D = 1.3 x 10(-2) exp(-0.25/kT).