Metrics-driven software quality prediction without prior fault data


Catal C., Sevim U., DİRİ B.

International Conference in Electronic Engineering and Computing Technology, London, United Kingdom, 1 - 03 July 2009, pp.189-199 identifier

  • Publication Type: Conference Paper / Full Text
  • Doi Number: 10.1007/978-90-481-8776-8_17
  • City: London
  • Country: United Kingdom
  • Page Numbers: pp.189-199