Neural network based transistor modeling and aspect ratio estimation for Yital 1 5 micron process

AVCI M., BABAÇ M. Y., YILDIRIM T.

Third International Conference on Electrical and Electronics Engineering (ELECO’2003), 3 - 07 December 2003, (Full Text)

• Publication Type: Conference Paper / Full Text
• Yıldız Technical University Affiliated: Yes