Dielectric Strength of WO3 Thin Films By Admittance and Ellipsometry Measurements

ÖZDEMİR O., CHOI F. P., BULGURCUOĞLU A. E., KUTLU K.

4th International Advances in Applied Physics and Materials Science Congress & Exhibition, Muğla, Turkey, 24 April 2014, pp.346

  • Publication Type: Conference Paper / Summary Text
  • City: Muğla
  • Country: Turkey
  • Page Numbers: pp.346
  • Yıldız Technical University Affiliated: Yes