The determination of the interface-state density distribution from the capasitance-frequency measurements in Au/n-Si Schottky Barrier diodes

NUHOĞLU Ç.

JOURNAL OF ELECTRONIC MATERIALS, vol.31, no.1, pp.119-123, 2002 (SCI-Expanded, Scopus)

• Publication Type: Article / Article
• Volume: 31 Issue: 1
• Publication Date: 2002
• Journal Name: JOURNAL OF ELECTRONIC MATERIALS
• Journal Indexes: Science Citation Index Expanded (SCI-EXPANDED), Scopus
• Page Numbers: pp.119-123
• Yıldız Technical University Affiliated: No