Dielectric Strength of WO3 Thin Films By Admittance and Ellipsometry Measurements


ÖZDEMİR O., GÖKDEMİR F. P., SAATCİ A. E., KUTLU K.

4th International Advances in Applied Physics and Materials Science Congress & Exhibition, Muğla Fethiye, Turkey, 24 - 27 April 2014, (Summary Text)

  • Publication Type: Conference Paper / Summary Text
  • City: Muğla Fethiye
  • Country: Turkey
  • Yıldız Technical University Affiliated: Yes