Oxide Layer Thickness Dependent Electrical Characterization of Al / Al2O3 / CdS MOS Structures


Serin M. , Çalışkan M. , Moğulkoç M.

TPS Turkish Physical Society 29th International Physics Congress, Muğla, Turkey, 5 - 08 September 2012, pp.607

  • Publication Type: Conference Paper / Summary Text
  • City: Muğla
  • Country: Turkey
  • Page Numbers: pp.607
  • Yıldız Technical University Affiliated: Yes