The Basic Principles of the Transmission Electron Microscope and Analysis of Structural Defects in GaN by High Resolution Electron Microscopy


YEŞİLKAYA S. S.

Summer School and Workshop on the Physics of Materials, Thessaloniki, Greece., 01 October 1999, vol.1, pp.33-39

  • Publication Type: Conference Paper / Full Text
  • Volume: 1
  • Page Numbers: pp.33-39