Band alignment and critical layer thickness of GaIn(N)As(Sb) QWs on GaAs and InP substrates


Gönül B., Köksal K., ODUNCUOĞLU M. , Bakır E.

E-MRS The European Material Conference, Strasbourg, France, 07 June 2010, pp.1

  • Publication Type: Conference Paper / Summary Text
  • City: Strasbourg
  • Country: France
  • Page Numbers: pp.1
  • Yıldız Technical University Affiliated: Yes