Characterization of Metal Ag Au Pc thin film Semiconductor Structures by Impedance Spectroscopy Technique


ORUÇ Ç., Erkol A., ALTINDAL A.

Science & Applications of Thin Films, Conference & Exhibition SATF 2016, 19 - 23 September 2016

  • Publication Type: Conference Paper / Summary Text
  • Yıldız Technical University Affiliated: Yes