Prediction of wheat quality parameters using near-infrared spectroscopy and artificial neural networks

MUTLU A., BOYACI İ. H., Genis H. E., Ozturk R., Basaran-Akgul N., Sanal T., ...Daha Fazla

EUROPEAN FOOD RESEARCH AND TECHNOLOGY, cilt.233, sa.2, ss.267-274, 2011 (SCI-Expanded) identifier identifier

  • Yayın Türü: Makale / Tam Makale
  • Cilt numarası: 233 Sayı: 2
  • Basım Tarihi: 2011
  • Doi Numarası: 10.1007/s00217-011-1515-8
  • Dergi Adı: EUROPEAN FOOD RESEARCH AND TECHNOLOGY
  • Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Sayfa Sayıları: ss.267-274
  • Yıldız Teknik Üniversitesi Adresli: Hayır

Özet

In wheat and flour processing, the quality control needs quick analytical tools for predicting physical, rheological, and chemical properties. In this study, near infrared reflectance (NIR) spectroscopy combined with artificial neural network (ANN) was used to predict the flour quality parameters that are protein content, moisture content, Zeleny sedimentation, water absorption, dough development time, dough stability time, degree of dough softening, tenacity (P), extensibility (L), P/G, strength, and baking test (loaf volume and loaf weight). A total of 79 flour samples of different wheat varieties grown in different regions of Turkey were chemically analyzed, and the results of both NIR spectrum (400-2,498 nm) and chemical analysis were used to train/test the network by applying various ANN architectures. Prediction of protein, P, P/G, moisture content, Zeleny sedimentation, and water absorption in particular gave a very good accuracy with coefficient of determination (R (2)) of 0.952, 0.948, 0.933, 0.920, 0.917, and 0.832, respectively. The results indicate that NIR combined with the ANN can successfully be used to predict the quality parameters of wheat flour.