Investigation of the transport properties of microcrystalline silicon by time-of-flight (TOF)

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Atıf İçin Kopyala

Serin M., Harder N., Carıus R.

JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, cilt.14, ss.733-734, 2003 (SCI-Expanded)

• Yayın Türü: Makale / Tam Makale
• Cilt numarası: 14
• Basım Tarihi: 2003
• Doi Numarası: 10.1023/a:1026151725719
• Dergi Adı: JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS
• Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus
• Sayfa Sayıları: ss.733-734
• Yıldız Teknik Üniversitesi Adresli: Evet

Özet

The transport properties of microcrystalline silicon have been studied by the time-of-flight technique on a 6.3-mum thick n-i-p solar cell illuminated from the p-side (n-side) to obtain electron (hole) current transients. The transients exhibit dispersive behavior. At room temperature, drift-mobility values of about 2-4 cm(2) V(-1) s(-1) and 2 cm(2) V(-1) s(-1) were deduced for electrons and holes, respectively. The dispersion parameters alpha(l) and alpha(2), as determined from the pre- and post-transit slopes of the current transients were similar to those for a-Si:H. (C) 2003 Kluwer Academic Publishers.