Timing Characterization of a Tester Operated Integrated Circuit by Continuous and Pulsed Laser Stimulation | AVESİS

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Timing Characterization of a Tester Operated Integrated Circuit by Continuous and Pulsed Laser Stimulation

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KIYAN T. , BRILLERT C., BOIT C.

International Symposium for Testing and Failure Analysis (ISTFA), 01 Kasım 2010