Timing Characterization of a Tester Operated Integrated Circuit by Continuous and Pulsed Laser Stimulation

KIYAN T., BRILLERT C., BOIT C.

International Symposium for Testing and Failure Analysis (ISTFA), 01 Kasım 2010

  • Yayın Türü: Bildiri / Tam Metin Bildiri
  • Yıldız Teknik Üniversitesi Adresli: Evet